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Measurement Techniques For Radio Frequency Nanoelectronics

Measurement Techniques For Radio Frequency Nanoelectronics - Kabos, Pavel; Wallis, T. Mitch - ISBN: 9781107120686
Prijs: € 119,70
Levertijd: 12 tot 15 werkdagen
Bindwijze: Boek, Gebonden
Genre: Techniek
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Beschrijving

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices.

Details

Titel: Measurement Techniques For Radio Frequency Nanoelectronics
auteur: Kabos, Pavel; Wallis, T. Mitch
Mediatype: Boek
Bindwijze: Gebonden
Taal: Engels
Aantal pagina's: 320
Uitgever: Cambridge University Press
Plaats van publicatie: 03
NUR: Techniek
Afmetingen: 247 x 174
ISBN/ISBN13: 9781107120686
Intern nummer: 38496353

Biografie (woord)

Pavel Kabos is a physicist in the Applied Physics Division at the National Institute of Standards and Technology. He is the author of Magnetostatic Waves and Their Applications (1993) and a Fellow of the Institute of Electrical and Electronics Engineers (IEEE).

Quote

Advance praise: 'This book is an invaluable resource for understanding the field of RF nanoelectronics and the challenges and practice of high frequency measurement technology at the nanoscale. It provides a comprehensive overview of how RF measurement techniques and nanotechnology measurement methodology have merged to realize new technologies such as near-field scanning microwave microscopy and RF scanning probe microscopy, as well as looking at practical applications in nanoscale semiconductor devices and circuits, nanomagnetic systems and the life sciences. The book is a very state-of-the-art treatise on the field of microwave technology at the nanoscale, which every student and practitioner in the field of RF nanoelectronics should have.' Stephen M. Goodnick, Arizona State University

Inhoudsopgave

1. An introduction to radio frequency nanoelectronics; 2. Core concepts of microwave and RF measurements; 3. Extreme-impedance measurements; 4. On-wafer measurements of RF nanoelectronic devices; 5. Modeling and validation of RF nanoelectronic devices; 6. Characterization of nanofiber devices; 7. Instrumentation for near-field scanning microwave microscopy; 8. Probe-based measurement systems; 9. Radio frequency scanning probe measurements of materials; 10. Measurement of active nanoelectronic devices; 11. Dopant profiling in semiconductor nanoelectronics; 12. Depth profiling; 13. Dynamics of nanoscale magnetic systems; 14. Nanoscale electromagnetic measurements for life science applications.

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