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Embedded Mechatronic Systems

Analysis of Failures, Predictive Reliability

Embedded Mechatronic Systems - ISBN: 9781785481895
Prijs: € 99,55 (onder voorbehoud)
Beschikbaarheid: Titel is niet in voorraad. Levertijd onbekend.
Bindwijze: Boek, Gebonden (15-11-2019)
Genre: Techniek
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Mechatronics brings together computer science, mechanics and electronics. It enables us to improve the performances of embedded electronic systems by reducing their weight, volume, energy consumption and cost. Mechatronic equipment must operate without failure throughout ever-increasing service lives. The particularly severe conditions of use of embedded mechatronics cause failure mechanisms which are the source of breakdowns. Until now, these failure phenomena have not been looked at with enough depth to be able to be controlled.

  • Provides a statistical approach to design optimization through reliability
  • Presents an experimental approach for the characterization of the development of mechatronic systems in operating mode
  • Analyzes new tools that effect thermal, vibratory, humidity, electric and electromagnetic stresses


Titel: Embedded Mechatronic Systems
Mediatype: Boek
Bindwijze: Gebonden
Taal: Engels
Druk: 2
Aantal pagina's: 274
Uitgever: Elsevier Science
Publicatiedatum: 2019-11-15
NUR: Techniek
Afmetingen: 229 x 152
ISBN/ISBN13: 9781785481895
Intern nummer: 39368447
Volume: 1

Biografie (woord)

Expert in reliability and product-process technology at Valeo, Philippe Pougnet is a doctor-engineer of the Scientific and Medical University of Grenoble and an INPG engineer. He is responsible for the management of the reliability of mechatronic systems manufactured in mass production.

Extra informatie

Illustrates new analytical tools and proposes two methodologies to highlight the evolution and optimization of these embedded mechatronic systems


1. Reliability-Based Design Optimization
2. Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices
3. Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities
4. Metrology of Static and Dynamic Displacements and Deformations Using Full-Field Techniques
5. Characterization of Switching Transistors under Electrical Overvoltage Stresses
6. Reliability OF Radio Frequency Power Transistors to Electromagnetic and Thermal Stress
7. Internal Temperature Measurement of Electronic Components
8. Reliability Prediction of Embedded Electronic Systems: the FIDES Guide
9. Study of the Dynamic Contact Between Deformable Solids


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