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Micro and Nano Technologies, Characterization of Nanoparticles

Measurement Processes for Nanoparticles

Vooraankondiging
Micro and Nano Technologies, Characterization of Nanoparticles - ISBN: 9780128141823
Prijs: € 173,90 (onder voorbehoud)
Beschikbaarheid: Nog niet verschenen.
Bindwijze: Boek, Paperback (30-09-2019)
Genre: Techniek
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Beschrijving

Characterization of Nanoparticles: Measurement Processes for Nanoparticles surveys this fast growing field, including established methods for the physical and chemical characterization of nanoparticles. The book focuses on sample preparation issues (including potential pitfalls), with measurement procedures described in detail. In addition, the book explores data reduction, including the quantitative evaluation of the final result and its uncertainty of measurement. The results of published inter-laboratory comparisons are referred to, along with the availability of reference materials necessary for instrument calibration and method validation. The application of these methods are illustrated with practical examples on what is routine and what remains a challenge.

In addition, this book summarizes promising methods still under development and analyzes the need for complementary methods to enhance the quality of nanoparticle characterization with solutions already in operation.



  • Helps readers decide which nanocharacterization method is best for each measurement problem, including limitations, advantages and disadvantages
  • Shows which nanocharacterization methods are best for different classes of nanomaterial
  • Demonstrates the practical use of a method based on selected case studies

Details

Titel: Micro and Nano Technologies, Characterization of Nanoparticles
Mediatype: Boek
Bindwijze: Paperback
Taal: Engels
Aantal pagina's: 566
Uitgever: Elsevier Science
Publicatiedatum: 2019-09-30
NUR: Techniek
Afmetingen: 235 x 191
ISBN/ISBN13: 9780128141823
Intern nummer: 44647590

Extra informatie

A survey of nanocharacterization techniques, examining the pros and cons of applying a variety of measurement techniques to different classes of nanomaterial

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