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Fault Diagnosis And Fault Tolerance

A Systematic Approach To Special Topics

Fault Diagnosis And Fault Tolerance - Chen, Tinghuai - ISBN: 9783540549628
Prijs: € 121,60
Levertijd: 12 tot 15 werkdagen
Bindwijze: Boek
Genre: Theoretische informatica
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With The Rapid Growth Of Integration Scale Of Vlsi Chips And The Present Need For Reliable Computers In Space Exploration, Fault Diagnosis And Fault Toleran Ce Have Become More Important Than Before, And Hence Reveal A Lot Of Interest Ing Topics Which Attract Many Researchers To Make A Great Number Of Contribu Tions To This Field.


Titel: Fault Diagnosis And Fault Tolerance
auteur: Chen, Tinghuai
Mediatype: Boek
Taal: Engels
Aantal pagina's: 197
Uitgever: Springer-verlag Berlin And Heidelberg Gmbh & Co. Kg
Plaats van publicatie: DE
NUR: Theoretische informatica
Afmetingen: 242 x 170
Gewicht: 380 gr
ISBN/ISBN13: 9783540549628
Intern nummer: 23512747


1 Four-Valued Logic and Its Applications.- 1.1 Introduction.- 1.2 Mathematical Basis.- 1.2.1 Four-Valued Boolean Algebra B4.- 1.2.2 Boolean Expression.- 1.2.3 Mapping B4n?B4 and Boolean Functions.- 1.2.4 Vector Forms.- 1.2.5 Canonical Forms.- 1.2.6 Expressions for Boolean Functions.- 1.3 STAR Expansions, Boolean Difference and Boolean Differential.- 1.3.1 Expansion Formulae.- 1.3.2 Boolean Difference.- 1.3.3 Boolean Differential.- 1.3.4 Geometrical Interpretation.- 1.4 Combined Components.- 1.4.1 Front and Rear Values.- 1.4.2 Binary Coding.- 1.4.3 Interpretation for Testing.- 1.5 Boolean Equations.- 1.5.1 Basic Concepts.- 1.5.2 A1·A2···An·j=0 with j=1,D,$$\overline D$$; and A1=x1 or $${{\overline x }_{1}}$$.- 1.5.3 Deriving Star Expansion Via Solving Equation.- 1.6 Test Generation for Combinational Circuits.- 1.6.1 Fault and (Static) Test.- 1.6.2 The Test for Single Fault.- 1.7 Statical Test Generation for Sequential Circuits.- 1.7.1 Example to Derive Tests.- 1.7.2 Comparison with Other Method.- 1.8 Identification of Hazards and Dynamic Testing.- 1.8.1 The Dynamic Behavior and Dynamic Tests of Combinational Circuit.- 1.8.2 Identification of Hazards.- 1.8.3 Dynamic Tests and Hazardous Tests.- 1.9 Transition Logic.- 1.9.1 Proposition Calculus and Predicate Calculus.- 1.9.2 Logical Inferences.- 1.9.3 Other Logic.- 1.10 Comparison with Other Logics.- 1.10.1 Addition of States.- 1.10.2 Extension to Power Set.- 1.10.3 Merging of States.- 1.10.4 Extension by Direct Product.- References.- 2 Computer System Diagnosis and Society Diagnosis.- 2.1 Introduction (PMC Model).- 2.1.1 Self-Diagnosis of System.- 2.1.2 Basic Definitions.- 2.2 One Step System Diagnosis for PMC Model.- 2.2.1 The Characterization Problem.- 2.2.2 Diagnosing Algorithm.- 2.2.3 Optimal Design.- 2.3 The Extension of System Diagnosis.- 2.3.1 Extension along Diagnostic Goals.- 2.3.2 Extension along Models.- 2.3.3 Extension along the State Values.- 2.3.4 Extension along Diagnosing Method.- 2.3.5 The Combination of Different Extensions.- 2.4 The Application of System Diagnosis.- 2.4.1 The Diagnosis for Analog Circuits.- 2.4.2 Fault-Tolerant Computing.- 2.4.3 Society Diagnosis.- References.- 3 Testability Design via Testability Measures.- 3.1 Introduction.- 3.1.1 The Problem of Testability and Its Measure.- 3.1.2 Definition of Testability and Measures.- 3.1.3 Testability in Term of Controllability and Observability.- 3.1.4 Testability Measure and Algorithm.- 3.1.5 J. Hayes' Suggestion.- 3.1.6 Problems Studied in this Chapter.- 3.2 Testability Design.- 3.2.1 Testability Measure.- 3.2.2 Means to Improve Testability.- 3.2.3 Constraints A,B,C,D,E and Objective Function F.- 3.2.4 ILP Problem for Testability.- 3.2.5 Asynchronous Sequential Circuits.- 3.2.6 Experimental Results.- 3.3 Design for Testability at Module Level.- 3.3.1 Definition of Testability.- 3.3.2 Probability Function Ill.- 3.3.3 Controllability Spectrum.- 3.3.4 Observability Spectrum.- 3.3.5 Modifications and Other Problems.- 3.4 Applications.- References.- 4 NMRC: A Technique for Redundancy.- 4.1 Introduction.- 4.2 NMRC System Model.- 4.2.1 System Description.- 4.2.2 Fault Pattern.- 4.2.3 Maximum Likelihood Selection.- 4.3 Analysis of Fault Tolerance Capability.- 4.3.1 Definitions.- 4.3.2 Module-FT Degree.- 4.3.3 Module-Comparator FT Degree.- 4.4 Optimal NMRC System Design.- 4.5 An Example for Comparison Analysis.- 4.5.1 Performance Comparison.- 4.5.2 Cost Comparison.- 4.5.3 Reliability Comparison.- 4.5.4 Diagnosability Comparison.- 4.6 Conclusion.- References.- 4.A.1 The Proof of Theorem 4.4.- 4.A.2 The Proof of Lemma 2.- 5 Fault Tolerance of Switching Interconnection ß-Networks.- 5.1 Introduction.- 5.1.1 Multicomputer Systems.- 5.1.2 Connecting Capability and Structure of ICN.- 5.1.3 ß-elements and ß-network.- 5.1.4 Communication Delay.- 5.1.5 Fault Model for a ß-element.- 5.2 General Inequalities.- 5.2.1 Proof of [log2n]+l ? d ? n.- 5.2.2 Proof of K ? d -1.- 5.3 ISE-MISE-RMISE.- 5.3.1 ISE.- 5.3.2 MISE.


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