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Fault Diagnosis And Fault Tolerance

A Systematic Approach To Special Topics

Fault Diagnosis And Fault Tolerance - Chen, Tinghuai - ISBN: 9783540549628
Prijs: € 121,60
Levertijd: 12 tot 15 werkdagen
Bindwijze: Boek
Genre: Theoretische informatica
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Beschrijving

With The Rapid Growth Of Integration Scale Of Vlsi Chips And The Present Need For Reliable Computers In Space Exploration, Fault Diagnosis And Fault Toleran- Ce Have Become More Important Than Before, And Hence Reveal A Lot Of Interest- Ing Topics Which Attract Many Researchers To Make A Great Number Of Contribu- Tions To This Field.

Details

Titel: Fault Diagnosis And Fault Tolerance
auteur: Chen, Tinghuai
Mediatype: Boek
Taal: Engels
Aantal pagina's: 197
Uitgever: Springer-verlag Berlin And Heidelberg Gmbh & Co. Kg
Plaats van publicatie: DE
NUR: Theoretische informatica
Afmetingen: 242 x 170
Gewicht: 380 gr
ISBN/ISBN13: 9783540549628
Intern nummer: 23512747

Inhoudsopgave

1 Four-Valued Logic and Its Applications.- 1.1 Introduction.- 1.2 Mathematical Basis.- 1.2.1 Four-Valued Boolean Algebra B4.- 1.2.2 Boolean Expression.- 1.2.3 Mapping B4n?B4 and Boolean Functions.- 1.2.4 Vector Forms.- 1.2.5 Canonical Forms.- 1.2.6 Expressions for Boolean Functions.- 1.3 STAR Expansions, Boolean Difference and Boolean Differential.- 1.3.1 Expansion Formulae.- 1.3.2 Boolean Difference.- 1.3.3 Boolean Differential.- 1.3.4 Geometrical Interpretation.- 1.4 Combined Components.- 1.4.1 Front and Rear Values.- 1.4.2 Binary Coding.- 1.4.3 Interpretation for Testing.- 1.5 Boolean Equations.- 1.5.1 Basic Concepts.- 1.5.2 A1·A2···An·j=0 with j=1,D,$$\overline D$$; and A1=x1 or $${{\overline x }_{1}}$$.- 1.5.3 Deriving Star Expansion Via Solving Equation.- 1.6 Test Generation for Combinational Circuits.- 1.6.1 Fault and (Static) Test.- 1.6.2 The Test for Single Fault.- 1.7 Statical Test Generation for Sequential Circuits.- 1.7.1 Example to Derive Tests.- 1.7.2 Comparison with Other Method.- 1.8 Identification of Hazards and Dynamic Testing.- 1.8.1 The Dynamic Behavior and Dynamic Tests of Combinational Circuit.- 1.8.2 Identification of Hazards.- 1.8.3 Dynamic Tests and Hazardous Tests.- 1.9 Transition Logic.- 1.9.1 Proposition Calculus and Predicate Calculus.- 1.9.2 Logical Inferences.- 1.9.3 Other Logic.- 1.10 Comparison with Other Logics.- 1.10.1 Addition of States.- 1.10.2 Extension to Power Set.- 1.10.3 Merging of States.- 1.10.4 Extension by Direct Product.- References.- 2 Computer System Diagnosis and Society Diagnosis.- 2.1 Introduction (PMC Model).- 2.1.1 Self-Diagnosis of System.- 2.1.2 Basic Definitions.- 2.2 One Step System Diagnosis for PMC Model.- 2.2.1 The Characterization Problem.- 2.2.2 Diagnosing Algorithm.- 2.2.3 Optimal Design.- 2.3 The Extension of System Diagnosis.- 2.3.1 Extension along Diagnostic Goals.- 2.3.2 Extension along Models.- 2.3.3 Extension along the State Values.- 2.3.4 Extension along Diagnosing Method.- 2.3.5 The Combination of Different Extensions.- 2.4 The Application of System Diagnosis.- 2.4.1 The Diagnosis for Analog Circuits.- 2.4.2 Fault-Tolerant Computing.- 2.4.3 Society Diagnosis.- References.- 3 Testability Design via Testability Measures.- 3.1 Introduction.- 3.1.1 The Problem of Testability and Its Measure.- 3.1.2 Definition of Testability and Measures.- 3.1.3 Testability in Term of Controllability and Observability.- 3.1.4 Testability Measure and Algorithm.- 3.1.5 J. Hayes' Suggestion.- 3.1.6 Problems Studied in this Chapter.- 3.2 Testability Design.- 3.2.1 Testability Measure.- 3.2.2 Means to Improve Testability.- 3.2.3 Constraints A,B,C,D,E and Objective Function F.- 3.2.4 ILP Problem for Testability.- 3.2.5 Asynchronous Sequential Circuits.- 3.2.6 Experimental Results.- 3.3 Design for Testability at Module Level.- 3.3.1 Definition of Testability.- 3.3.2 Probability Function Ill.- 3.3.3 Controllability Spectrum.- 3.3.4 Observability Spectrum.- 3.3.5 Modifications and Other Problems.- 3.4 Applications.- References.- 4 NMRC: A Technique for Redundancy.- 4.1 Introduction.- 4.2 NMRC System Model.- 4.2.1 System Description.- 4.2.2 Fault Pattern.- 4.2.3 Maximum Likelihood Selection.- 4.3 Analysis of Fault Tolerance Capability.- 4.3.1 Definitions.- 4.3.2 Module-FT Degree.- 4.3.3 Module-Comparator FT Degree.- 4.4 Optimal NMRC System Design.- 4.5 An Example for Comparison Analysis.- 4.5.1 Performance Comparison.- 4.5.2 Cost Comparison.- 4.5.3 Reliability Comparison.- 4.5.4 Diagnosability Comparison.- 4.6 Conclusion.- References.- 4.A.1 The Proof of Theorem 4.4.- 4.A.2 The Proof of Lemma 2.- 5 Fault Tolerance of Switching Interconnection ß-Networks.- 5.1 Introduction.- 5.1.1 Multicomputer Systems.- 5.1.2 Connecting Capability and Structure of ICN.- 5.1.3 ß-elements and ß-network.- 5.1.4 Communication Delay.- 5.1.5 Fault Model for a ß-element.- 5.2 General Inequalities.- 5.2.1 Proof of [log2n]+l ? d ? n.- 5.2.2 Proof of K ? d -1.- 5.3 ISE-MISE-RMISE.- 5.3.1 ISE.- 5.3.2 MISE.

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